Reflection Electron Microscopy for Crystal Analysis - AZoM

7/18/2022 12:00:00 AM2 years 9 months ago
The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it the method of choice when studying surface structures and …
The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes i… [+6694 chars]
full article...