Secondary Ion Mass Spectrometry and Focused Ion Beam-SEM Combine - AZoNano

A magnetic sector secondary ion mass spectrometry was integrated with a focused ion beam (FIB)–scanning electron microscopy (SEM) instruments for nanoscale investigations.

The complete characterization of a sample for its chemical composition, morphology, and structure in three dimensions (3D) at the nanoscale range is quintessential for scientific progress in any fiel… [+6096 chars]

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